Optima Design automation, a pioneer in Functional Safety and ISO 26262 fault analysis technology targeting hard and soft error analysis for accelerated semiconductor development of up to 1,000X performance improvement over traditional fault simulation for automotive and other safety critical applications
Due to travel restrictions associated with the Coronavirus, Optima’s team to DVCon was not able to attend DVCon in person. Instead, Optima will be conducting live, virtual demos from their Booth #406 at DVCon. Attendees are invited to stop by during show hours to meet with Optima’s CEO Jamil Mazzawi for a one on one conversation about specific Functional Safety and ISO-26262 design challenges or a quick demonstration of the company’s next generation functional safety products.
WEBINAR: Introduction to Functional Safety and ISO-26262 for chip designers
In addition, Optima will be organizing three Webinars about Functional Safety challenges, targeted to newcomers to Functional Safety and ISO 26262. The Webinars will be held the last week of March and first week of April, at three different times, to match people in the time-zones of US, Europe and Asia.
Registration for the Webinar can be done here: https://forms.gle/FtiDDbqbKq8p6KfR8
Optima’s Functional Safety Solutions:
The Optima Safety Platform includes a set of solutions, or “apps”, built on top of the company’s FIE technology that automates key ISO 26262 verification requirements. The platform targets Hard and Soft Error analysis, essential in certifying the safe operation of automotive semiconductor devices to the ISO 26262 Functional Safety standard.
- Optima-SA™: Static analysis is automated tool that provides early identification of Functional Safety implementation flaws and provide fault-mode sizing for the FMEDA process, debug of Functional Safety problems and others..
- Optima-HE™: Hard-error analysis is accelerated over 1,000X than existing solutions to measure diagnostic coverage, then automatically improve it using Optima’s Coverage Maximizer™ technology.
- Optima-SE™: Soft-error analysis may now be completed in a reasonable time, allowing reducing FIT rate from transient-faults to close to zero with minimal silicon cost.
DVCon US exhibitions are open March 2-5
Monday, March 2, 20205:00 – 7:00pm
Tuesday, March 3, 2020 2:30 – 6:00pm
Wednesday, March 4, 2020 2:30 – 6:00pm
Optima is at Booth #406, the DoubleTree Hotel in San Jose, CA, USA